As semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://johnnymdowf.bloggip.com/39709354/system-level-verification-as-a-critical-pillar-of-modern-vlsi-design